首页> 外国专利> METHOD OF TESTING PHOTOELECTRIC PARAMETERS OF PHOTOCELL UNIT

METHOD OF TESTING PHOTOELECTRIC PARAMETERS OF PHOTOCELL UNIT

机译:光电池单元光电参数的测试方法

摘要

FIELD: electronics. SUBSTANCE: method comprises steps of applying illumination onto an active surface of all photocells in order to evaluate quality of separate photocells; then placing a member for differential illumination between the light source and active surface of the photocells; scanning the active surface of the photocells; measuring their output voltage; removing the light source; applying a bias voltage on each photocell, being tested, and measuring dark current, being occurred in the circuit. EFFECT: enhanced accuracy of parameter testing. 1 cl, 2 dwg
机译:领域:电子产品。物质:该方法包括以下步骤:将照明施加到所有光电池的活性表面上,以评估单独的光电池的质量。然后在光源和光电池的有效表面之间放置一个用于差异照明的部件。扫描光电池的有效表面;测量其输出电压;卸下光源;在测试中的每个光电管上施加偏置电压,并测量电路中发生的暗电流。效果:提高了参数测试的准确性。 1厘升,2载重吨

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号