A method for calibrating of an x-ray system, and for the measurement of the equivalent thickness of an object.

摘要

The calibration method consists in carrying out measurements of yield d of a detector cell, placed under the object, as a function of the different thicknesses ep standards and the power supply voltages vm of the x-ray tube. these measurements make it possible to determine an analytical model d = f (vm, ep), which describes the obtained curves 21 to 25. The inverse function of this analytical model makes it possible to calculate the thickness ep as a function of the yield d measured and known to the supply voltage vm.