首页> 外国专利> COATING THICKNESS MEASURING METHOD AND COATING THICKNESS MEASURING DEVICE FOR COATING ON BOARD

COATING THICKNESS MEASURING METHOD AND COATING THICKNESS MEASURING DEVICE FOR COATING ON BOARD

机译:用于板上涂层的涂层厚度测量方法和涂层厚度测量装置

摘要

PROBLEM TO BE SOLVED: To measure a coating thickness of a coating on a wide area board together with precise position information. ;SOLUTION: Processing such as dividing of a command signal to a synchronous motor (open-controllable stepping motor) serving as a driving source, which moves a base board to be measured or a measuring device, is carried out at need, and synchronously with the command signal, position information (measurement positions 1, 2, 3,...) based on a drive of the synchronous motor and coating thickness information (measurement values za1, za2, za3,...) are extracted at the same time. From a head information in the measurement information, a displacement pattern is extracted, and on the basis of the characteristic of the displacement pattern, an absolute position is computed, and then, the absolute value is added to the measurement information, and consequently, the absolute position information for the measurement position is obtained.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:测量大面积板上的涂层厚度以及精确的位置信息。 ;解决方案:根据需要,将命令信号分配到作为驱动源的同步电动机(可控式步进电动机)进行处理,该电动机使要测量的基板或测量设备移动,并与之同步命令信号,基于同步电动机的驱动的位置信息(测量位置1、2、3,...)和涂层厚度信息(测量值za 1 ,za 2 < / Sub>,za 3 ,...)被同时提取。从测量信息中的头部信息中提取位移模式,并基于位移模式的特性计算绝对位置,然后将绝对值添加到测量信息中,因此获得测量位置的绝对位置信息。;版权:(C)1997,日本特许厅

著录项

  • 公开/公告号JPH09126749A

    专利类型

  • 公开/公告日1997-05-16

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;FUJITSU VLSI LTD;

    申请/专利号JP19950282810

  • 发明设计人 KADOWAKI TETSUJI;

    申请日1995-10-31

  • 分类号G01B21/08;G02F1/13;

  • 国家 JP

  • 入库时间 2022-08-22 03:36:48

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