首页> 外国专利> MEASUREMENT EQUIPMENT FOR DECENTRATION OF ASPHERICAL LENS

MEASUREMENT EQUIPMENT FOR DECENTRATION OF ASPHERICAL LENS

机译:球面镜镜片偏心的测量设备

摘要

PROBLEM TO BE SOLVED: To improve precision of decentration measurement by allowing an incidence optical system to include at least one optical element wherein astigmatic difference can be variably generated, or the astigmatic difference amount can be variably compensated, so that observed reflection spot diameter is suppressed to sufficiently small one. ;SOLUTION: The incidence optical system which makes light flux incident on a sample lens surface 11 comprises a light source 101 movable in the light axis direction, a beam splitter 5 which divides the light from the visible semiconductor laser light source 101, a projection lens 3, a mirror 111 movable in the direction of arrow x1. Further the incidence optical system in provided with an optical element 1 wherein, assigned between the light source 101 and the beam splitter 5, astigmatic difference can be variably generated. With the function of the element 1, appropriate astigmatic difference is supplied to incident light flux so that the astigmatic difference disappear in the light flux reflected on the sample lens surface 11.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:通过允许入射光学系统包括至少一个光学元件来提高偏心测量的精度,其中光学元件可以可变地产生像散差,或者可以可变地补偿像散量,从而抑制观察到的反射光斑直径足够小。 ;解决方案:使光束入射到样品透镜表面11上的入射光学系统包括:沿光轴方向可移动的光源101;将来自可见半导体激光光源101的光分开的分束器5;投影透镜。如图3所示,镜子111可沿箭头x1的方向移动。此外,入射光学系统包括光学元件1,其中,在光源101和分束器5之间分配的光学元件可以可变地产生像散差。利用元件1的功能,适当的像散差被提供给入射光束,使得在样本透镜表面11上反射的光束中的像散差消失。;版权所有:(C)1997,JPO

著录项

  • 公开/公告号JPH09222380A

    专利类型

  • 公开/公告日1997-08-26

    原文格式PDF

  • 申请/专利权人 OLYMPUS OPTICAL CO LTD;

    申请/专利号JP19960030598

  • 发明设计人 OSHIKIRI MINORU;

    申请日1996-02-19

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-22 03:36:10

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