Height adjustment for the dummy in total reflection X-ray fluorescence analyzer

摘要

(57) Abstract Objective Dripping the liquid sample on the substrate, the dry test which it makes dryThe height level of charge to measurable, total reflection fluorescent x-ray analysesIt improves the analysis precision in. Constitution On surface 71 of substrate 70, dummy 1 for height controlLateral plate 2 of pair is mounted. dami for this height control- As for 1, in underside 3 of the above-mentioned both lateral plates 2, surface of lower board 4 of pair5 junction, we to be constituted, the whole with the hollow square shape, inThe aperture 6 for incidence of primary x-ray B1 is formed to middle. GlowflyIn vicinity of optical x-ray detector 60, distance detector 30 layoutThe re te it is. This distance detector 30 and fluorescent x-ray detector 60Opposing to sample base 40, it is laid out. The above-mentioned distance inspectionOut, the light B4 like the infrared ray radiation to do vessel 30, on lower board 4Depending upon the incident position of reflected light B5 from of measurement 0.20, measuringLevel of fixed point 20 is detected.