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Growth method null of InP crystallizing on Si

机译:InP在Si上结晶的生长方法无效

摘要

PURPOSE:To obtain a InP epitaxial layer of good crystallinity on a Si substrate, by feeding the clean surface of the substrate with a In chloride followed by phosphine. CONSTITUTION:A Si substrate 14 is set in the upper tier growth chamber 13, being heat-treated at ca. 1,000 deg.C either in a hydrogen gas atmosphere free from group-V matter or in a vacuum to remove the oxides on the surface of said substrate followed by cooling to 350-600 deg.C. Thence, this substrate is transferred to the lower tier growth chamber 11 followed by feeding HCl and In from source boat 12 to make InCl adsorb on the substrate 14. This substrate 14 is then transferred to the upper tier growth chamber 13 again followed by feeding phosphine to grow InP crystal, thus effecting growth of a InP epitaxial layer by repeating this process.
机译:目的:通过在衬底的清洁表面上加入一氯化铟,然后加入磷化氢,在硅衬底上获得具有良好结晶度的InP外延层。组成:Si衬底14设置在上层生长室13中,并在约200℃下进行热处理。在无V族物质的氢气气氛中或在真空中在1000℃下除去所述衬底表面上的氧化物,然后冷却至350-600℃。因此,该衬底被转移到下层生长室11,然后从源舟皿12进料HCl和In以使InCl吸附在衬底14上。然后该衬底14再次被转移到上层生长室13,然后进料磷化氢。使InP晶体生长,从而通过重复该过程来实现InP外延层的生长。

著录项

  • 公开/公告号JP2576134B2

    专利类型

  • 公开/公告日1997-01-29

    原文格式PDF

  • 申请/专利权人 NIPPON ELECTRIC CO;

    申请/专利号JP19870175105

  • 发明设计人 MATSUMOTO TAKU;

    申请日1987-07-13

  • 分类号C30B29/40;C30B25/14;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-22 03:28:45

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