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Significant difference method of detection null of sheet condition suffering inspection

机译:检验薄板状况零点的显着差异方法

摘要

PURPOSE:To prevent an image from affecting on the detection of a defect, by masking an image detection signal in a mask range irrelevant to the contour of the image. CONSTITUTION:Reflected light from a sheetlike material 1 to be inspected is scanned axially with a camera 5, video information obtained is taken into a contour extracting means 6 to extract the contour of an image 2 and a defect 3. An output from the extracting means 6 is written sequentially into a memory means 10 capable of simultaneously writing and reading performing an automatic updating by scrolling in synchronization with a running position information of the object 1 being inspected. Then, after a set frequency, pattern information written into the memory means 10 is read out sequentially as contour mask output to be inputted into a comparison means together with the current output to be inspected. This comparison means 12 detects pattern information differing from the subsequent frequency of pattern information read out of a binary coding circuit 13 for defects as significant difference.
机译:目的:通过在与图像轮廓无关的屏蔽范围内屏蔽图像检测信号,以防止图像影响缺陷检测。组成:要检查的片状材料1的反射光用相机5轴向扫描,获得的视频信息被带入轮廓提取装置6中,以提取图像2和缺陷3的轮廓。提取装置的输出将图6所示的记录顺序地写入到存储装置10中,该存储装置10能够通过与被检查对象1的行进位置信息同步地滚动来同时写入和读取以执行自动更新。然后,在设定的频率之后,顺序地读出写入存储装置10中的图案信息作为轮廓掩模输出,以与要检查的电流输出一起输入到比较装置中。该比较装置12将与从二进制编码电路13中读出的图案信息的后续频率不同的图案信息检测为显着差异的缺陷。

著录项

  • 公开/公告号JP2597370B2

    专利类型

  • 公开/公告日1997-04-02

    原文格式PDF

  • 申请/专利权人 株式会社ヒューテック;

    申请/专利号JP19870258683

  • 发明设计人 大西 隆嗣;

    申请日1987-10-14

  • 分类号G01N21/89;

  • 国家 JP

  • 入库时间 2022-08-22 03:28:36

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