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A duo-coil device for absolute value measurement of magnetic field penetration distance of a large-area high-temperature superconductor thin film

机译:用于大面积高温超导体薄膜的磁场穿透距离绝对值测量的双线圈装置

摘要

The present invention relates to an apparatus for measuring the absolute magnitude of a magnetic penetration depth Of a large-area superconductor thin film using a weak magnetic field of a low frequency or a direct current. In the superconducting state, the magnetic field is completely blocked, State high-temperature superconductor thin film, which is a sample to be measured by making a sufficiently low transition temperature thin film having a characteristic of being transparent to a magnetic field when it is in a state, and a conventional two-coil apparatus ), It is possible to perform zero measurement of the twin-coil device and measurement of the sample film in a single measurement, thereby solving the mechanical problems caused by the zero adjustment.
机译:本发明涉及一种使用低频或直流的弱磁场来测量大面积超导体薄膜的磁穿透深度的绝对量的装置。在超导状态下,磁场被完全阻挡,状态高温超导薄膜,是通过制作足够低的转变温度薄膜来测量的样品,该薄膜的特性是当处于高温时对磁场透明状态和传统的双线圈装置),可以通过单次测量对双线圈装置进行零测量和对样品膜进行测量,从而解决了由零调整引起的机械问题。

著录项

  • 公开/公告号KR970024332A

    专利类型

  • 公开/公告日1997-05-30

    原文格式PDF

  • 申请/专利权人 김은영;

    申请/专利号KR19950033693

  • 发明设计人 이주영;최상삼;한택상;

    申请日1995-10-02

  • 分类号H01L39/12;

  • 国家 KR

  • 入库时间 2022-08-22 03:17:42

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