FIELD: physics. SUBSTANCE: X-ray polarimeter comprises semiconductor X-ray converter and data recording and processing unit. Converter is made in the form of pile of photocells composed of alternating semiconductor and metal layers with thickness of each layer of the order of path length of primary photoelectrons generated in process of beam absorption of X-ray photons directed along layers. Effective atomic number of semiconductor is much higher than atomic number of metal. Amplitude of registered signals of converter depends on degree of polarization of X-ray radiation and on value of azimuthal angle between polarization plane and planes of layers of converter which makes it possible to determine degree and direction of polarization by measured degree of anisotropy of distribution of signals amplitudes with the use of calibration data. Invention may be used for diagnostics of supershot plasma including thermonuclear, nonequilibrium and inhomogeneous plasma in laboratory, natural and astrophysical experiments. EFFECT: improved operational reliability and stability. 1 dwg
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