首页> 外国专利> Scanning probe microscope - has probe holder, fixed to guide rail, moving macroscopically along rail with all microscope components, including test item but excluding probe holder and the probe, solidly linked together

Scanning probe microscope - has probe holder, fixed to guide rail, moving macroscopically along rail with all microscope components, including test item but excluding probe holder and the probe, solidly linked together

机译:扫描探针显微镜-具有固定在导轨上的探针支架,沿着导轨与所有显微镜组件一起宏观移动,包括测试项目,但不包括探针支架和探针,它们牢固地连接在一起

摘要

The microscope has a body (1), one or more piezoelectric moving elements (2) and a probe (5) which is fixed to a probe holder (4) which moves macroscopically along a guide rail (3). All the microscope components including the test item (6), but excluding the probe holder and the probe, are solidly linked together. The guide rails and probe holder can be pressed together mechanically by springs or clamps or by a combination of magnet and magnetic materials. A further guide rail can be fitted between the first guide rail and the holder along which macroscopic movements can be made.
机译:该显微镜具有主体(1),一个或多个压电移动元件(2)和固定在探针支架(4)上的探针(5),探针支架(4)沿导轨(3)宏观移动。所有显微镜组件,包括测试项目(6),但不包括探头固定器和探头,都牢固地连接在一起。可以通过弹簧或夹具或将磁铁和磁性材料组合在一起,将导轨和探头支架机械地压在一起。可以在第一导轨和保持器之间安装另一导轨,沿着该导轨可以进行宏观运动。

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