Holographic grating production method

摘要

The method records an interference pattern from two point sources of light on a photo-sensitive film applied to the back of a substrate. For the optimisation of image quality the substrate thickness, radius of curvature and refractive index are used as correction parameters. For application in spectroscopic analysers, the holographic grating is positioned on the back of the substrate (T) relative to an entrance slit (A) and a detector (E). The deviation from the ideal half-width of a spectrum can be reduced below 0.1 nm.