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Encoding apparatus for making measurements of two-dimensional displacement of an object

机译:用于测量物体的二维位移的编码装置

摘要

An encoding apparatus includes: a light source; a diffraction grating, including a number of fine grating portions orthogonally arranged in columns and rows in a diffraction grating surface, for producing first diffracted light rays and second diffracted light rays in accordance with light emitted from the light source, each of the first diffracted light rays having a direction cosine on a first plane, and each of the second diffracted light rays having a direction cosine on a second plane; an interference unit for producing a first interference light ray by subjecting two diffracted light rays of the first diffracted light rays to interference, and for producing a second interference light ray by subjecting two diffracted light rays of the second diffracted light rays to interference; a first detection unit for detecting a phase change of the first interference light ray when an object is moved relative to the light source; and a second detection unit for detecting a phase change of the second interference light ray when the object is moved relative to the light source.
机译:一种编码设备,包括:光源;和衍射光栅,包括在衍射光栅表面上垂直排列成行和列的多个细光栅部分,用于根据从光源发出的光产生第一衍射光和第二衍射光,每个第一衍射光在第一平面上具有方向余弦的光线,以及在第二平面上具有方向余弦的每个第二衍射光线;干涉单元,其通过使第一衍射光的两条衍射光受到干涉而产生第一干涉光,并通过使第二衍射光的两条衍射光受到干涉而产生第二干涉光。第一检测单元,当物体相对于光源移动时,检测第一干涉光线的相位变化;第二检测单元,用于在物体相对于光源移动时检测第二干涉光的相位变化。

著录项

  • 公开/公告号US5579111A

    专利类型

  • 公开/公告日1996-11-26

    原文格式PDF

  • 申请/专利权人 RICOH COMPANY LTD.;

    申请/专利号US19950552167

  • 发明设计人 HIDEO MAEDA;

    申请日1995-11-02

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-22 03:11:00

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