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Surface position detecting method and apparatus including detection and correction of errors, such as surface position errors or tilt, in exposure regions

机译:表面位置检测方法和装置,包括检测和校正曝光区域中的诸如表面位置误差或倾斜之类的误差。

摘要

A registration method is usable with projection optical system for projecting first and second patterns of a first object simultaneously upon a second object having a surface step, for measuring at different locations the surface position of the second object with respect to the direction of an optical axis of the projection optical system prior to the pattern projection to bring the surface of the second object into coincidence with an image plane of the projection optical system on the basis of the measurement, wherein the first pattern has a smaller depth of focus than that of the second pattern. The method includes bringing the surface position of the second object, at the location whereat the first pattern is to be projected, into coincidence with the image plane of the projection optical system; and correcting any tilt of the surface of the second object with respect to the image plane of the projection optical system.
机译:配准方法可与投影光学系统一起使用,以将第一物体的第一和第二图案同时投射到具有表面台阶的第二物体上,以在不同位置测量第二物体相对于光轴方向的表面位置在图案投影之前进行投影光学系统的成像,以根据测量结果使第二物体的表面与投影光学系统的像面重合,其中第一图案的聚焦深度小于第二种模式。该方法包括使第二物体的表面位置在要投影第一图案的位置处与投影光学系统的像平面重合。校正第二物体的表面相对于投影光学系统的像平面的任何倾斜。

著录项

  • 公开/公告号US5602400A

    专利类型

  • 公开/公告日1997-02-11

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号US19960636723

  • 发明设计人 HARUNA KAWASHIMA;

    申请日1996-04-23

  • 分类号G01N21/86;

  • 国家 US

  • 入库时间 2022-08-22 03:10:35

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