首页>
外国专利>
Enhanced test system for an application-specific memory scheme
Enhanced test system for an application-specific memory scheme
展开▼
机译:针对特定应用的内存方案的增强测试系统
展开▼
页面导航
摘要
著录项
相似文献
摘要
An enhanced test system in a processor having a memory supporting multiple memory schemes. The memory is partitioned into memory blocks and memory sub-blocks. A plurality of uniform data units each comprising a plurality of data fields is written to and read from each successive memory block in a FIFO manner so that a data field within each data unit, having a maximum field width, occupies each of the multiple memory locations at least once during testing. The enhanced test system maximizes the number of adjacent full-width data fields to test vertically and horizontally for field overflow within memory by writing and reading seriatim by data unit or partitioned by data field width, in adjacent memory blocks and sub-blocks, or overlapping memory blocks and overlapping sub-blocks.
展开▼