Method and circuit structure for measuring and testing discrete components on mixed-signal circuit boards

摘要

A structure for measuring and testing discrete components interconnected with one or more integrated circuits on a mixed-signal circuit board. Each integrated circuit includes a test cell comprising a plurality of switches connected with a single on-chip bus which is in turn connected with a single circuit board bus. The structure permits a constant current to be supplied to the components over the single bus and voltage measurements to be made to determine the component values with a lower overhead in pins and board area.