首页> 外国专利> In epitaxy growing of the silicon carbide, and as a result the manner which makes the formation of the micro flexible pipe decrease in the silicon carbide structure which is formed

In epitaxy growing of the silicon carbide, and as a result the manner which makes the formation of the micro flexible pipe decrease in the silicon carbide structure which is formed

机译:在碳化硅的外延生长中,结果使得在形成的碳化硅结构中使微柔性管的形成减少的方式

摘要

A method is disclosed for producing epitaxial layers of silicon carbide that are substantially free of micropipe defects. The method comprises growing an epitaxial layer of silicon carbide on a silicon carbide substrate by liquid phase epitaxy from a melt of silicon carbide in silicon and an element that enhances the solubility of silicon carbide in the melt. The atomic percentage of that element predominates over the atomic percentage of silicon in the melt. Micropipe defects propagated by the substrate into the epitaxial layer are closed by continuing to grow the epitaxial layer under the proper conditions until the epitaxial layer has a thickness at which micropipe defects present in the substrate are substantially no longer reproduced in the epitaxial layer, and the number of micropipe defects in the epitaxial layer is substantially reduced.
机译:公开了一种用于生产基本上没有微管缺陷的碳化硅外延层的方法。该方法包括通过液相外延从碳化硅在硅中的熔体和增强碳化硅在熔体中的溶解度的元素通过液相外延在碳化硅衬底上生长碳化硅的外延层。该元素的原子百分比占主导地位,超过熔体中硅的原子百分比。通过在适当的条件下继续生长外延层,直到外延层的厚度使基体中存在的微管缺陷基本上不再在外延层中再现,从而封闭由基板传播到外延层中的微管缺陷,直至封闭。显着减少了外延层中微管缺陷的数量。

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