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CONTROLLER FOR DISPLAYING KLM MARKER IN ELECTRON PROBE MICROANALYZER, ETC.
CONTROLLER FOR DISPLAYING KLM MARKER IN ELECTRON PROBE MICROANALYZER, ETC.
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机译:在ETC电子探针微分析仪中显示KLM标记的控制器。
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摘要
PROBLEM TO BE SOLVED: To obtain a display control apparatus by which specific X-rays of an element to be observed are displayed clearly. ;SOLUTION: In a display control apparatus 2 for a KLM marker in an electron probe microanalyzer, an element name and the marker of its position are displayed on an analytical profile collected frpm an electron probe microanalyzer 1 or the like. The display control apparatus is provided with a marker-information table 22 which comprises position information on a marker so as to correspond to every line kind and every order for every element. Then, when an element, a line type and an order are designated by a marker designation part 4 as information used to display the marker, position information on the line type and the order of a corresponding element is read out from the marker-information table 22, and the marker is displayed in the position.;COPYRIGHT: (C)1998,JPO
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