METHOD FOR SCREENING THERMISTOR ELEMENT WITH NEGATIVE CHARACTERISTICS

摘要

PROBLEM TO BE SOLVED: To screen and eliminate a thermistor element where an internal defect occurred by measuring a capacitance between electrodes formed on a main flat surface within a specific frequency range. ;SOLUTION: A thermistor element 2 with negative characteristics used, for example, for compensating the temperature of a temperature sensor or a semiconductor is screened. More specifically, by measuring a capacitance between electrodes 1 formed on a main surface for the element 2 with manganese and cobalt as main constituents, the element 2 where a defect is included inside is screened and eliminated. Since an internal defect 2b generated inside the element 2, namely a crack, a pore, or the phase of a crystal structure that differs from the main crystal structure phase has different specific dielectric constant, the element 2 where the defect 2b is generated can be easily screened and eliminated by measuring a capacitance. The capacitance can be measured within a frequency range of 5kHz-5MHz, since, when the frequency is lower than 5kHz, the capacitance scatters greatly and, when it is higher than 5MHz, the difference to a normal element disappears.;COPYRIGHT: (C)1998,JPO