Time resolution fluorescent excitation spectrum measurement equipment

摘要

PURPOSE: To allow measurement of time-resolved fluorescent excitation spectrum over a wide energy region by measuring the excitation spectrum of crossing correlation light of a fluorescent light emitted from a semiconductor material and an optical gate pulse. ;CONSTITUTION: Optical pulses from a quite short pulse light source 1 are branched by an optical element 5 into a sample excitation light and a gate pulse light. The sample excitation light is projected onto a point of a nonlinear optical crystal 3 of a sample 16 through an optical system 6. The gate pulse light is projected onto same point of the crystal 3 through an optical system 10. The crystal 3 is then rotated on a rotary stage 4 and a conversion light generated therefrom is introduced to a spectrometer 17 and measured by means of a signal analyzer 14. The sample 16 is then irradiated with the light from a continuous oscillation light source 2 and a conversion light component is extracted by the analyzer 14 thus measuring the fluorescent excitation spectrum at an arbitrary time lag. Measurement is performed while varying the difference of optical path length of an optical delay path 9 and the operation is repeated by a controller 15 thus measuring the time-resolved fluorescent excitation spectrum.;COPYRIGHT: (C)1994,JPO&Japio