A METHOD FOR TESTING AN INTEGRATED CIRCUITRY AND AN INTEGRATED CIRCUIT HAVING A PLURALITY OF FUNCTIONAL COMPONENTS AND HAVING JUNCTION/SWITCH (PLS SEE FILE FOR FULL TITLE)

摘要

The invention proposes a testing method and associatedarrangement for electronic circuitry that combines func-tional components that are interconnectcd by handshakechannels. Various of such channels are now provided with aninbreaking junction and an outbreaking switch as a testcomponent pair The junction has two passive ports and oneactive port. The switch has one passive port and two activeports that are selected through a passive control port. In thisway inbreaking into and outbreaking from the channel isrendered feasible. Now inbreaking is done an a first channel,and outbreaking on a second channel, so that thereby allcomponents are tested that lie between the first channel'sjunction and the second channel's switch.