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InGaAsP / InP BH LD Manufacturing Method

机译:InGaAsP / InP BH LD制造方法

摘要

The present invention provides a step of sequentially growing an n-InP buffer layer, InGaAsP active layer, p-InP cladding layer and a P + -InGaAsP cap layer to, n-InP substrate in production as a InGaAsP / InP BH LD, a P + -InGaAsP cap layer After the removal, forming a stripe with a silicon oxide film on the p-InP clad layer, forming a mesa with a melt bag by the liquid phase growth method, growing a current blocking layer, and after removing the silicon oxide film stripe The manufacturing method comprising the step of growing a p-InP clad layer and a P + -InGaAsP cap layer in turn, in the conventional method for producing BH LD by the liquid phase growth method in the step of forming a mesa structure While several etching and cleaning processes have to be used, in the present invention, the mesa is formed by the melt bag by one liquid phase growth method using the silicon oxide film stripe. Followed by growing the current blocking layer relates to the production of InGaAsP / InP BH LD method has the effect of shortening the manufacturing process.
机译:本发明提供了如下步骤:将n-InP缓冲层,InGaAsP有源层,p-InP包层和P + -InGaAsP覆盖层顺序生长为生产中的n-InP衬底。 InGaAsP / InP BH LD,P + -InGaAsP覆盖层去除后,在p-InP覆盖层上形成带有氧化硅膜的条纹,通过液体形成带有熔体袋的台面相生长法,生长电流阻挡层以及去除氧化硅膜条之后的制造方法包括依次生长p-InP覆盖层和P + -InGaAsP盖层的步骤,在形成台面结构的步骤中通过液相生长法制造BH LD的常规方法中,虽然必须使用多种蚀刻和清洁工艺,但是在本发明中,台面是由熔融袋通过一个液相形成的生长方法采用氧化硅膜条。随后生长的电流阻挡层涉及到InGaAsP / InP BH LD的生产方法,具有缩短制造工艺的作用。

著录项

  • 公开/公告号KR19980029350A

    专利类型

  • 公开/公告日1998-07-25

    原文格式PDF

  • 申请/专利权人 권문구;

    申请/专利号KR19960048605

  • 发明设计人 송준석;박인식;정낙진;신기철;

    申请日1996-10-25

  • 分类号H01S3/0941;

  • 国家 KR

  • 入库时间 2022-08-22 02:48:24

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