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DISPLACEMENT MEASURING DEVICE BASED ON SEMICONDUCTOR INJECTION LASER WITH EXTERNAL OPTICAL FEEDBACK
DISPLACEMENT MEASURING DEVICE BASED ON SEMICONDUCTOR INJECTION LASER WITH EXTERNAL OPTICAL FEEDBACK
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机译:基于带有外部光学反馈的半导体注入激光的位移测量装置
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摘要
FIELD: optical measurements. SUBSTANCE: device has optical head consisting of injection laser, photodiode, microscope objective and controlled filter. In addition, device has control unit which includes regulator of laser current and temperature, triangle-voltage generator, photocurrent-to-voltage converter, selective amplifier, and indicator. Use is also made of pulse phase detector, comparator and reversible counter. EFFECT: higher measurement results. 3 dwg
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