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X-ray and neutron diffractometric imaging of the internal structure of objects

机译:物体内部结构的X射线和中子衍射成像

摘要

A method and device for examining the internal structure of an object uses diffracted X-rays or other penetrating radiation. In one embodiment, spatial filters proximate to a source of radiation transmit an array of divergent pixel-beams which irradiate an object being examined. The object absorbs, refracts, diffracts, and incoherently scatters radiation from the pixel-beams. Spatial filters proximate to a detector block undeflected and refracted radiation which exits the object. The detector separately measures diffracted radiation for each pixel- beam. For example, an integral of the diffracted intensity around a pixel- beam provides a pixel intensity in an image of the object. Alternatively, analyzing the intensity in a diffraction pattern around a pixel-beam can identify structures and materials within the object. A non-invasive procedure identifies abnormal tissue by measuring radiation diffracted at an angle characteristic of the diffraction pattern for abnormal tissue. In one embodiment of the invention, two spatial filters which form the pixel- beams have arrays of apertures with apertures in the first and second filters along lines from the source. This allow the pixel-beams to be divergent and increases the percentage of usable radiation from the source.
机译:用于检查物体的内部结构的方法和设备使用衍射的X射线或其他穿透辐射。在一个实施例中,靠近辐射源的空间滤光片透射发散的像素光束的阵列,所述阵列发散的像素光束照射被检查的对象。物体吸收,折射,衍射并且非相干地散射来自像素光束的辐射。靠近检测器的空间滤光片可阻挡从物体射出的未偏转和折射的辐射。该检测器分别测量每个像素光束的衍射辐射。例如,围绕像素光束的衍射强度的积分提供了物体图像中的像素强度。或者,分析像素光束周围衍射图样的强度可以识别物体内的结构和材料。非侵入性程序通过测量以用于异常组织的衍射图的角度特征来衍射的辐射来识别异常组织。在本发明的一个实施例中,形成像素光束的两个空间滤光器具有孔的阵列,在第一和第二滤光器中沿着来自源的线具有孔。这允许像素光束发散,并增加了来自光源的可用辐射的百分比。

著录项

  • 公开/公告号US5717733A

    专利类型

  • 公开/公告日1998-02-10

    原文格式PDF

  • 申请/专利权人 QUANTA VISION INC.;

    申请/专利号US19950454909

  • 发明设计人 ALEXEY V. KURBATOV;PAVEL I. LAZAREV;

    申请日1995-05-31

  • 分类号G01N23/20;

  • 国家 US

  • 入库时间 2022-08-22 02:40:12

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