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Mass spectrometer utilizing high energy product density permanent magnets

机译:利用高能积密度永磁体的质谱仪

摘要

A small radii mass spectrometer that utilizes high energy density permanent magnets of greater than 10E7 GOe for focusing an ion trajectory. The ion optical path employs focusing of the parallel component of the beam emitted by the source such that the momentum selected beam is focused in 90° geometry at or near the exit pole face. The width of the beam at the focal point is independent of the size of the beam exiting the ion source in first order but has a second order aberration term dependent on the source width and radius of curvature. The dominant terms in determining the collected beam width are the angular divergence of the source (which can be reduced by defining slit) and the energy spread of the ion beam. A second magnet may be used in tandem with the first magnet to cancel the second order aberration term and reduces the background created by ions scattering with residual gas molecules in the vacuum chamber. A slit between the tandem magnets is used in concert with a final defining slit to increase the resolution. Standard source technology including sample inlet through gas chromatography may be used for the ion source and the separated ion beam output may be used for mass spectrometry, ion implantation, leak detection, nuclear reaction phenomenology, and any other applications requiring a separated mass beam.
机译:一种小型半径质谱仪,利用大于10E7 GOe的高能量密度永磁体聚焦离子轨迹。离子光路采用聚焦源发出的光束的平行分量,以使选定的动量光束以90°几何形状聚焦在出口极面处或附近。束在焦点处的宽度与一阶离开离子源的束的大小无关,但具有取决于源宽度和曲率半径的二阶像差项。确定收集束宽度的主要术语是源的角度发散(可通过定义狭缝来减小)和离子束的能量散布。第二磁体可以与第一磁体串联使用,以消除第二阶像差项,并减小由离子与真空室内的残留气体分子散射而产生的背景。串联磁体之间的狭缝与最终定义的狭缝配合使用,以提高分辨率。包括通过气相色谱进样的样品在内的标准离子源技术可用于离子源,分离的离子束输出可用于质谱分析,离子注入,泄漏检测,核反应现象学以及任何其他需要分离质量束的应用。

著录项

  • 公开/公告号US5723862A

    专利类型

  • 公开/公告日1998-03-03

    原文格式PDF

  • 申请/专利权人 FORMAN;LEON;

    申请/专利号US19960610370

  • 发明设计人 LEON FORMAN;

    申请日1996-03-04

  • 分类号H01J49/26;

  • 国家 US

  • 入库时间 2022-08-22 02:40:06

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