首页>
外国专利>
Pattern recognition by unsupervised metric learning
Pattern recognition by unsupervised metric learning
展开▼
机译:无监督度量学习的模式识别
展开▼
页面导航
摘要
著录项
相似文献
摘要
A pattern recognition method uses unsupervised metric learning starting from a mixture of normal densities which explains well observed data. An improved decision rule is provided for selecting the reference database element most likely to correspond to a query.
展开▼