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Performance main leadership die BIST technology

机译:性能领先者BIST技术

摘要

(57) Abstract It is while circuit designing, technique in order to choose the flip-flop of the optimum group which it should convert to BIST element is disclosed. This holds down the degradation in efficiency which is brought from that kind of conversion to minimum. If you follow this invention, while circuit designing the addition timing delay which is brought as the result of each conversion to BIST element of flip-flop those is installed while choosing the flip-flop which it should convert, because of this, is thought that only conversion possible flip-flop, is ideal in conversion, without bringing timing disturbance as the result. All logical cycles inside the circuit are divided, these ideal the smallest group of flip-flop, after that, is chosen for BIST conversion. Therefore, as for the choice technique which you follow this invention, while holding down augmentation of the silicon area which originates in BIST conversion to minimum it converts the fault cover maximally not only, it can hold down degradation in efficiency to minimum.
机译:(57)<摘要>公开了在电路设计时,为了选择应转换为BIST元件的最佳组的触发器的技术。这抑制了效率降低,这种效率降低是由这种转换带来的。如果遵循本发明,则在电路设计中将每次转换到触发器的BIST元素所带来的附加定时延迟的设计是在选择应转换的触发器的同时安装的,因此,仅转换可能的触发器,是转换的理想选择,而不会带来时序干扰。电路内的所有逻辑周期均被划分,然后选择这些最小的触发器组进行BIST转换。因此,对于遵循本发明的选择技术,在将源自BIST转换的硅面积的增加抑制为最小限度的同时,不仅最大程度地转换了故障覆盖率,而且还能够将效率的降低抑制为最小限度。

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