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CIRCUIT FOR MEASURING CURRENT OF IC TESTER BASED ON IMPRESSED VOLTAGE
CIRCUIT FOR MEASURING CURRENT OF IC TESTER BASED ON IMPRESSED VOLTAGE
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机译:基于外加电压的IC测试仪电流测量电路
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摘要
PROBLEM TO BE SOLVED: To obtain a current measuring circuit on impressing voltage for use in testing, e.g. whether or not a leak current flows to an input pin of a logic IC element comprising a CMOS. SOLUTION: A current detection resistor 21 is inserted in series to the output side of a driver 13 used at a function test, and a switch 41 is connected in parallel to the resistor 21. The switch 41 is turned on at the function test. When presence/absence of an input lead of a CMOS device 11 is to be measured, the switch 41 is turned off, switches 42, 43 are turned on sequentially, and a voltage at both ends of the resistor 21 is detected by an AD converter 45. This operation is carried out for a block 12-1 to 12-n corresponding to each pin. A difference of voltage at both ends of the resistor of each block is obtained, thereby detecting the presence/absence, a size of the input leak.
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