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CIRCUIT FOR MEASURING CURRENT OF IC TESTER BASED ON IMPRESSED VOLTAGE

机译:基于外加电压的IC测试仪电流测量电路

摘要

PROBLEM TO BE SOLVED: To obtain a current measuring circuit on impressing voltage for use in testing, e.g. whether or not a leak current flows to an input pin of a logic IC element comprising a CMOS. SOLUTION: A current detection resistor 21 is inserted in series to the output side of a driver 13 used at a function test, and a switch 41 is connected in parallel to the resistor 21. The switch 41 is turned on at the function test. When presence/absence of an input lead of a CMOS device 11 is to be measured, the switch 41 is turned off, switches 42, 43 are turned on sequentially, and a voltage at both ends of the resistor 21 is detected by an AD converter 45. This operation is carried out for a block 12-1 to 12-n corresponding to each pin. A difference of voltage at both ends of the resistor of each block is obtained, thereby detecting the presence/absence, a size of the input leak.
机译:要解决的问题:要获得一个用于测试的外加电压电流测量电路,例如泄漏电流是否流到包括CMOS的逻辑IC元件的输入引脚。解决方案:电流检测电阻器21串联插入功能测试中使用的驱动器13的输出侧,并且开关41与电阻器21并联连接。开关41在功能测试时接通。当要测量CMOS器件11的输入引线的存在/不存在时,开关41断开,开关42、43依次导通,并且AD转换器检测电阻器21两端的电压。 45.针对与每个引脚相对应的块12-1至12-n执行该操作。获得每个块的电阻器两端的电压差,从而检测输入泄漏的有无。

著录项

  • 公开/公告号JPH11174113A

    专利类型

  • 公开/公告日1999-07-02

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP;

    申请/专利号JP19970342835

  • 发明设计人 HASHIMOTO YOSHIHIRO;

    申请日1997-12-12

  • 分类号G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-22 02:35:43

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