INTERNAL VOLTAGE SETTING CIRCUIT, SUBSTRATE VOLTAGE CLAMP CIRCUIT, SUBSTRATE BIAS GENERATING CIRCUIT, BOOSTING VOLTAGE CLAMP CIRCUIT, AND WORD LINE VOLTAGE GENERATING CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide an internal voltage setting circuit which can perform an operation test in which operation guarantee margin is sufficiently secured independently of dispersion of a characteristic of a transistor caused by dispersion of a process. ;SOLUTION: Diode elements 100 are connected in series, and internal voltage V which is provided with the prescribed potential difference for input voltage Vin is set based on forward direction voltage drop. A switch element 101 is connected to the diode element 100, and increases and decreases the number of stages of the diode element 100 so that operation guarantee margin of internal voltage is enlarged based on a test mode signal T inputted at the time of operation test.;COPYRIGHT: (C)1999,JPO