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Noise filter characteristic measurement apparatus and measurement method, and noise filter selection apparatus and the selection method used it

机译:噪声滤波器特性测量装置和测量方法,以及所使用的噪声滤波器选择装置和选择方法

摘要

[Abstract] Disclosed is suppression of noise emitted from the electronic device itself is subject to noise and attenuation characteristics of the noise filter to be used for improved resistance to noise from the outside, the actual use of electronic devices accurately measured at the corresponding conditions to the situation, which was the database, to allow a minimum of noise measures in a simple manner. A noise filter characteristic measuring apparatus, the impedance with a variable load 6, and the load 6 noise filter 1 is connected to, the measurement unit 4 to measure the attenuation characteristics of the noise by the noise filter 1, the noise filter 1 A first noise injection part 2 disposed on the front side of the load 6 for a second noise injection part 3 arranged from the noise filter 1 on the front side of the load 6, the first noise injection measurement unit 4 from section 2 through the load 6 and noise filter 1 Leading to and includes a first measurement circuit, and a second measurement circuit from the second noise injection part 3 to the measuring unit 4 through the noise filter 1 and the load 6. The measured attenuation characteristics of the noise filter 1 into a database, and selects an optimum noise filter for each noise target device.
机译:[摘要]公开的是抑制从电子设备本身发出的噪声而受到噪声和噪声过滤器衰减特性的影响,以用于提高对来自外部的噪声的抵抗能力,在实际使用电子设备的条件下准确地测量出这种情况就是数据库,以便以一种简单的方式减少噪声。噪声滤波器特性测量装置,具有可变负载6的阻抗和噪声滤波器1的负载6连接到测量单元4,以测量噪声滤波器1,噪声滤波器1A首先对噪声的衰减特性。噪声注入部2设置在负载6的前侧,用于第二噪声注入部3,该第二噪声注入部3从负载6的前侧的噪声滤波器1布置,第一噪声注入测量单元4从部分2经过负载6,并且噪声滤波器1经由噪声滤波器1和负载6从第二噪声注入部分3到测量单元4引入并包括第一测量电路和第二测量电路。数据库,并为每个噪声目标设备选择一个最佳噪声滤波器。

著录项

  • 公开/公告号JP2912339B1

    专利类型

  • 公开/公告日1999-06-28

    原文格式PDF

  • 申请/专利权人 茨城県;

    申请/专利号JP19980067842

  • 发明设计人 大力 賢次;

    申请日1998-03-02

  • 分类号G01R31/00;

  • 国家 JP

  • 入库时间 2022-08-22 02:30:25

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