首页> 外国专利> Processes for measuring the intensity of the fluorescent radiant energy by a fluorescent agent the amount of radiation curable monomer or oligomer in a radiation cured coating and the oxygen concentration in a curing chamber

Processes for measuring the intensity of the fluorescent radiant energy by a fluorescent agent the amount of radiation curable monomer or oligomer in a radiation cured coating and the oxygen concentration in a curing chamber

机译:通过荧光剂测量荧光辐射能强度,辐射固化涂层中可辐射固化单体或低聚物的量以及固化室中氧气浓度的方法

摘要

A method of measuring intensity of radiant energy fluoresced by a fluorescer in a radiation-cured coating. The method comprising the steps of: a) providing a coating comprising: i) a radiation-curable monomer or oligomer; and ii) a fluorescer having an excitation energy at a wavelength lambda 2, the fluorescer fluorescing radiant energy of a wavelength lambda 3; b) curing the coating by exposure to radiant energy, thereby changing the intensity of radiant energy that would be fluoresced by the fluorescer if exposed to wavelength lambda 2; c) illuminating the radiation-cured coating with excitation energy of a wavelength lambda 2, wherein at least 50% of the excitation energy is absorbed by the upper 75 mu m of the radiation-cured coating; and d) measuring the intensity of the radiant energy fluoresced by the fluorescer at wavelength lambda 3. The above method can be used to measure the amount of residual radiation-curable monomer or oligomer present in a radiation-cured coating. This method of measuring residual monomer is especially useful where the intensity of the radiant energy fluoresced by the fluorescer at wavelength lambda 3 changes with the concentration of unreacted radiation-curable monomer or oligomer in the radiation-cured coating.
机译:一种测量由辐射固化涂层中的荧光剂发出荧光的辐射能强度的方法。该方法包括以下步骤:a)提供包含以下的涂层:i)可辐射固化的单体或低聚物; ii)具有在波长λ2处的激发能的荧光剂,该荧光剂发出波长λ3的发荧光剂。 b)通过暴露于辐射能来固化涂层,从而改变如果暴露于波长λ2时荧光增白剂发出荧光的辐射能的强度; c)用波长为λ2的激发能照射辐射固化的涂层,其中至少50%的激发能被辐射固化涂层的上部75μm吸收; d)测量荧光增白剂在波长λ3处发出的荧光的强度。上述方法可用于测量在辐射固化涂层中残留的可辐射固化单体或低聚物的量。这种测量残留单体的方法特别适用于荧光增白剂在波长为3的情况下发出的荧光能量随辐射固化涂层中未反应的辐射固化单体或低聚物的浓度而变化的情况。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号