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the method in the context of the analysis of the development of the signal viterbi - hyvyyslukujen analysis obtained for binary numbers

机译:在信号维特比展开分析的背景下进行分析的方法-针对二进制数的hyvyyslukujen分析

摘要

A signal is transmitted to a reciever and is digitalised in signal points (S1). These points are viterbi analysed in an analyser with a path memory (PM) having a desired number of states (00, 01, 10, 11) with memory cells (MC). Bit sequences, corresponding to the signal points (S1), are generated and final metric values (m0, m1 + g1, m1, m3) for the bit sequences are calculated. In an indicated bit position the best bit sequence, with the smallest final metric value (m2), has a "1", which is the decied bit value. An alternative bit sequence is generated, which is the best bit sequence with the smallest final metric value (m0 + g0) under the condition that in the indicated bit position there is a bit with the opposite bit value, a "0". The difference between both the final metric values (m0 + g0 - m2) is a quality factor for the decided bit value "1". The calculation is made in three steps. At a time point metric values (m0, m1, m2, m3) have been calculated for the different states (00, 01, 10, 11). For a signal point in the indicated bit position, additive metric values ( (0-0), (1-0)) are calculated in the first step. From the additive metric values are calculated new metric values and part values of the quality factor. In the second step the part values are modified for the calculation steps through the path memory (PM), so that final part values (g0, g1, g2, g3) of the quality factor are obtained. In the third step bit sequences are selected as above and the quality factor (m0+g0-m2) is calculated.
机译:信号被发送到接收器,并在信号点被数字化(S1)。在具有路径存储器(PM)的分析仪中对这些点进行维特比分析,该存储器具有具有存储单元(MC)的所需状态数(00、01、10、11)。生成与信号点(S1)相对应的位序列,并计算出这些位序列的最终度量值(m0,m1 + g1,m1,m3)。在指示的位位置中,具有最小最终度量值(m2)的最佳位序列具有“ 1”,这是分频后的位值。生成一个备用位序列,该条件是在指示的位位置中存在一个具有相反位值的位“ 0”的情况下,最终度量值最小的最佳位序列(m0 + g0)。两个最终度量值(m0 + g0-m2)之间的差是确定的位值“ 1”的质量因数。计算分三步进行。在某个时间点,已针对不同状态(00、01、10、11)计算了度量值(m0,m1,m2,m3)。对于指示位位置中的信号点,在第一步中计算附加度量值((0-> 0),(1-> 0))。从附加度量值中计算出新的度量值和品质因数的部分值。在第二步中,通过路径存储器(PM)修改零件值以进行计算,从而获得质量因数的最终零件值(g0,g1,g2,g3)。在第三步中,如上所述选择位序列,并计算出品质因数(m0 + g0-m2)。

著录项

  • 公开/公告号FI102334B1

    专利类型

  • 公开/公告日1998-11-13

    原文格式PDF

  • 申请/专利权人 OY L M ERICSSON AB;

    申请/专利号FI19910002177

  • 发明设计人 HAMMAR CLAES LENNART;

    申请日1991-05-06

  • 分类号H03M13/00;

  • 国家 FI

  • 入库时间 2022-08-22 02:27:35

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