The invention refers to an experimental piece of equipment for measuring the effect of radiation on the parameters of digital integrated circuits, which allows for the measuring of the static parameters of an integrated circuit subject to testing (T), placed in socket (S); the unit consists of an I-V converter, to whose input a pin of the socket (S) is connected, the other pins can be fed from two adjustable voltage sources (V1, V2), the socket (S) being fitted on a copper support through which cooling water passes, while the integrated circuit subject to testing (T) is irradiated by an electron beam generated by a linear accelerator; at the output (V) of the I-V converter a voltage proportional to the current (I) at the converter's input (O) is generated; the converter is also fitted with two terminals (A-B) to which an external milliamp metre can be connected to measure the same current (I), without influencing the operation mode of the integrated circuit subject to testing (T).
展开▼
