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Method for controlling microscopes and apparatus connected thereto by direction of view analysis using an apparatus for measuring direction of view and a suitable eyepiece attachment
Method for controlling microscopes and apparatus connected thereto by direction of view analysis using an apparatus for measuring direction of view and a suitable eyepiece attachment
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机译:通过使用视场测量装置和合适的目镜附件的视场分析来控制显微镜的方法和与其相连的设备
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摘要
The invention relates to a method for controlling microscopes and apparatus connected thereto by analysis of the direction of view. It further relates to an apparatus for measuring the direction of view and an eyepiece attachment for carrying out said method. The aim of the invention is to provide a method, an apparatus for measuring the direction of view and an attachment of the type described above which make it possible to control the microscope and any apparatus operating in the working area of said microscope exclusively by means of the optical data of the observer's eyes without resulting in disruptive reflexes or incorrect handling of the microscope. To this end, a highly diffuse light with a wavelength of between 800 and 1000 nm is used as infrared light which is generated coaxially around the eye of the observer at the level of the eyepiece tube. In addition, in the beam path of the optical system at least one other infrared signal is generated which is independent of the site of production of the diffuse light and directed at the eye of the observer, which infrared signal has an intensity different from that of the diffuse light and a wavelength of between 800 and 1000 nm and is subjected to the diffuse light so as to produce at least one additional corneal reflex.
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