The present invention relates to a positron application analyzer for analyzing microstructural defects of a sample by measuring positron decay time after passing a positron through a sample, and more particularly, to a miniaturized positron application And an analysis device.;The miniaturized apparatus for analyzing a positron of the present invention detects a gamma ray generated by a positron in a positron source and a gamma ray generated in a process of the positron penetrating into the sample and contacting electrons in the sample, An electronic module cabinet for analyzing the microstructural defects of the sample by receiving the electrical signals generated from the detector and the sample cabinet to determine the lifetime of the positron, and an electronic module cabinet for storing and analyzing the positron lifetime signal A computer, a vibration isolator installed between the detector, the sample cabinet and the electronic module cabinet for absorbing vibrations transmitted from each other and from the outside, and a cart for facilitating the movement by loading the detector and the sample cabinet and the electronic module cabinet So that various devices for positron application analysis can be collected. By a superior effect that to facilitate the movement as well as to miniaturize the whole system, it is possible in the analysis of samples, and analysis is possible even by providing a preliminary position of the detector when the size of the sample is greater.
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