FAULT MODE ESTIMATING SYSTEM USING ABNORMAL CURRENT AND V-I CHARACTERISTICS

摘要

In a system for evaluating a failure mode of a semiconductor device, at least one specific functional test pattern (FTP) is generated and delivered to the semiconductor device. If an abnormal current I _ddq is detected, VI characteristics of the semiconductor device are detected and compared with reference VI characteristics for a specific failure mode, thereby evaluating that a specific failure mode has occurred.