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DEVICE TRANSFER APPARATUS AND DEVICE REINSPECTION METHOD FOR IC HANDLER
DEVICE TRANSFER APPARATUS AND DEVICE REINSPECTION METHOD FOR IC HANDLER
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机译:IC处理器的装置转移装置及装置重新检查方法
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摘要
It is an object of the present invention to realize an IC conveying apparatus in which the rod-shaped container cloth is applicable to both types of containers of a tray type container. In addition, a device retest method is realized in the handler for IC testers in which the DUT stored in the magazine is retested without interposing a human hand and stored in the magazine and the customer tray.;For this reason, as a 1st Example, the tray supply part 172 which transfers and replaces the user tray 17O to the test tray 18O is provided in the supply side of a 1st device, and the rod-shaped container 15O is provided as a supply side of a 2nd device. And a magazine supply section (152) and a peak carrier section (112) for transporting the test tray (180) to the test tray (180). As a second embodiment, the inspection setting 201 for setting the number of re-inspections, the method of classifying the inspection results, and the storage tray / magazine is performed, and the DUT 215 is loaded 203 from the magazine to the test tray 180 and tested. (205), (205) determines whether the retest mode is valid after the end of the test (204). If YES, the DUT 215 for retesting is collectively stored in the unloader 223 (206), and the tray is It transfers from the conveying apparatus 227 to the loader part 222, and sorts and stores 212 when the retest mode is complete | finished, and completes the test of the DUT 215 (213).
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