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Constant temperature and humidity chamber with balance for measuring moisture absorption of semiconductor package

机译:恒温恒湿室,带天平,用于测量半导体封装的吸湿率

摘要

The present invention discloses a chamber for constant temperature and humidity having a scale for measuring the moisture absorption of a semiconductor package. The chamber of the present invention is to provide a moisture absorption atmosphere for measuring the moisture content contained in the package, and the balance includes a sample plate in which a semiconductor package for weight measurement is placed, and a dish tray in which the sample plate is placed. A load cell for measuring the load applied to the dish tray, and an elastic member connected to the sample dish and descending from the original position when the load is applied to the sample dish and restoring to the original position when the load is removed. Include.
机译:本发明公开了一种用于恒温恒湿的腔室,该腔室具有用于测量半导体封装的水分吸收的刻度。本发明的腔室用于提供用于测量包装中容纳的水分含量的吸湿气氛,并且天平包括其中放置有用于重量测量的半导体包装的样品板以及其中样品板的盘状托盘。被放置。测力传感器,其用于测量施加到盘托盘上的载荷,以及弹性构件,其连接到样品盘并且当载荷被施加到样品盘时从原始位置下降,并且当去除载荷时恢复到原始位置。包括。

著录项

  • 公开/公告号KR19990028773U

    专利类型

  • 公开/公告日1999-07-15

    原文格式PDF

  • 申请/专利权人 김영환;

    申请/专利号KR19970041411U

  • 发明设计人 김보영;

    申请日1997-12-27

  • 分类号H01L23/28;

  • 国家 KR

  • 入库时间 2022-08-22 02:14:05

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