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Thickness gauging of single-layer conductive materials with two- point non linear calibration algorithm
Thickness gauging of single-layer conductive materials with two- point non linear calibration algorithm
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机译:用两点非线性校准算法测量单层导电材料的厚度
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摘要
A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.
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