首页>
外国专利>
The electric current probe, the production method and the core and the electric current probe array null which are used for its
The electric current probe, the production method and the core and the electric current probe array null which are used for its
展开▼
机译:用于其的电流探头,制造方法以及芯和电流探头阵列为零
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To achieve a current probe array for measuring the lead current of an LSI by placing it on an already installed LSI tester. ;SOLUTION: A current probe 2 in a configuration enabling connection to a leading wire 3 is incorporated on the upper surface or the surface layer of an insulation substrate 4. Each pin of an LSI tester is inserted into a hole 21 of each current probe 3 to measure current that flows to each pin, thus measuring the lead current of the LSI by placing a current probe array on an already installed LSI tester since the side of the LSI tester needs not be changed at all.;COPYRIGHT: (C)1999,JPO
展开▼