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VAPOR PHASE DOPING APPARATUS AND VAPOR PHASE DOPING METHOD

机译:汽相掺杂装置及汽相掺杂方法

摘要

PROBLEM TO BE SOLVED: To provide a vapor phase doping apparatus and a method with which in-plane uniformity in an impurity diffused layer having a shallow joint can be improved. ;SOLUTION: A semiconductor substrate 11 is placed on a susceptor 10 within a reactor furnace 1, and a PH3 gas is fed into the reactor furnace 1 through a quartz gas nozzle 12, thereby doping the substrate 11 with P. In this processing, the PH3 gas jetted out of a gas diffusion hole 12a of the nozzle 12 is allowed to reflect at the inner wall of the reaction furnace 1, and the gas stream is directed at an angle of 45° to 90°, preferably at an angle vertical or approximately vertical to the surface of the substrate 11.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:提供一种汽相掺杂装置和方法,利用该汽相掺杂装置和方法,可以改善具有浅缝的杂质扩散层的面内均匀性。 ;解决方案:将半导体衬底11放在反应炉1内的基座10上,将PH3气体通过石英气体喷嘴12注入反应炉1中,从而用P掺杂衬底11。从喷嘴12的气体扩散孔12a喷出的PH3气体在反应炉1的内壁反射,气流以45°至90°的角度,优选垂直或90°的角度被引导。大约垂直于基材11的表面;版权:(C)2000,JPO

著录项

  • 公开/公告号JP2000195812A

    专利类型

  • 公开/公告日2000-07-14

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19980367230

  • 发明设计人 ATSUMI KENJI;

    申请日1998-12-24

  • 分类号H01L21/223;

  • 国家 JP

  • 入库时间 2022-08-22 02:03:24

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