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DEVICE FOR ANALYZING VARIATION IN THICKNESS, DEVICE FOR CONTROLLING THICKNESS AND METHOD THEREOF AND ROLLING MILL PROVIDED WITH THICKNESS CONTROLLER
DEVICE FOR ANALYZING VARIATION IN THICKNESS, DEVICE FOR CONTROLLING THICKNESS AND METHOD THEREOF AND ROLLING MILL PROVIDED WITH THICKNESS CONTROLLER
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机译:厚度变化分析装置,厚度控制装置以及厚度控制装置及其轧制方法
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摘要
PROBLEM TO BE SOLVED: To provide a device for analyzing the variation in thickness and thickness controller for rolling mills with which the primary factor of the variation in thickness is estimated easily and highly accurately and thickness control is executed with high accuracy based on this estimated result. ;SOLUTION: The thickness of a material to be rolled or the rolling load applied to the material to be rolled is measured, the bispectrum or the bicoherence of the measured signal consisting of the thickness or the rolling load is determined (bispectrum calculating part 5) and a means (cause estimating parts 8) for analyzing the primary factor of the variation in the thickness of the material to be rolled is analyzed using the bispectrum or the bicoherence is provided. And a means for changing the control law of thickness control in a rolling mill and opitimizing the thickness based on the analyzed primary factor of the variation in thickness of the material to be rolled is provided.;COPYRIGHT: (C)2000,JPO
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