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APPARATUS FOR SEARCHING GENERATION CAUSE OF ABNORMALITY

机译:寻找异常产生原因的装置

摘要

PROBLEM TO BE SOLVED: To obtain a searching apparatus, for the generation cause of an abnormality, by which the generation cause of the abnormality can be searched easily and in a short time. ;SOLUTION: A database reference device is installed in such a way that an operated value, a worked value and a measured value from the plant operation start of a plant apparatus and a measuring device which is connected to the apparatus are input from an abnormality data storage device 5, a working-record storage device 10 and a related apparatus database 11. When the measured value detects an abnormal value only the operated value, the worked value and the measured value, in the past, of the apparatus to which the measuring device is connected from the related apparatus database 11 and an apparatus related to the apparatus are extracted from the abnormality data storage device 5 and the working-record storage device 10, and they are displayed on an abnormality-information display device in a time series manner.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:为了得到一种异常发生原因的搜索装置,可以容易且在短时间内搜索异常发生的原因。 ;解决方案:安装数据库参考设备的方式是,从异常数据输入从工厂设备的工厂运行开始的操作值,工作值和测量值以及与该设备连接的测量设备存储设备5,工作记录存储设备10和相关设备数据库11。当测量值检测到异常值时,过去测量的设备仅操作值,工作值和测量值从相关设备数据库11连接该设备,并且从异常数据存储设备5和工作记录存储设备10中提取与该设备相关的设备,并且它们以时间序列的方式显示在异常信息显示设备上。;版权:(C)2000,日本特许厅

著录项

  • 公开/公告号JP2000065694A

    专利类型

  • 公开/公告日2000-03-03

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP19980238053

  • 发明设计人 TANABE KENGO;

    申请日1998-08-25

  • 分类号G01M19/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:58:26

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