首页> 外国专利> POLISHING SLURRY CONTAINING RARE EARTH ADDITIVE OF DUAL ATOMIC VALENCY

POLISHING SLURRY CONTAINING RARE EARTH ADDITIVE OF DUAL ATOMIC VALENCY

机译:含稀土原子双价原子的污泥的抛光

摘要

PROBLEM TO BE SOLVED: To obtain a polishing slurry which enables a refractory metal to act as a polish stop member by incorporating a suspension contg. abrasive particles and rare earth ions of a dual atomic valency or a colloidal hydroxide thereof into the slurry. ;SOLUTION: This slurry contains a suspension contg. 0.2-20 wt.% abrasive particles having a particle size of 10-1,000 nm and selected from among alumina, silica, ceria, etc., and 0.05-2 wt.% rare earth ions having a dual atomic valency (e.g. Ce4+ or Pr4+) or colloidal hydroxide thereof having a particle size of 5-100 nm. On the top of an SiO2 substrate 1 having a pattern formed thereon, an Nb liner 3 is placed as a polish stop member and thereon is formed an Al layer 2. The Al layer 2 is polished at a certain polishing rate with the polishing slurry. Since the Al layer of the patternized part is thinner than the other parts, it is polished faster. When the polishing reaches the Nb liner 3, the rare earth ions in the slurry are oxidized into Nb2O5, which stops the polishing process. Then, Nb2O5 is removed with a silica slurry.;COPYRIGHT: (C)2000,JPO
机译:要解决的问题:获得一种抛光浆料,通过加入悬浮液,该浆料能够使难熔金属充当抛光停止部件。磨料颗粒和双原子价的稀土离子或其胶态氢氧化物进入浆料。 ;解决方案:此浆液包含悬浮液。从氧化铝,二氧化硅,二氧化铈等中选择的粒径为10-1,000 nm的0.2-20 wt。%磨料颗粒和具有双原子价的稀土离子(例如Ce4 +或Pr4 + )或其粒径为5-100 nm的胶体氢氧化物。在其上形成有图案的SiO 2衬底1的顶部上,放置Nb衬里3作为抛光停止构件,并在其上形成Al层2。用抛光浆料以一定的抛光速率抛光Al层2。由于图案化部分的Al层比其他部分薄,因此抛光速度更快。当抛光到达Nb衬垫3时,浆液中的稀土离子被氧化成Nb2O5,这将停止抛光过程。然后,用二氧化硅浆料除去Nb2O5 .;版权所有:(C)2000,JPO

著录项

  • 公开/公告号JP2000038574A

    专利类型

  • 公开/公告日2000-02-08

    原文格式PDF

  • 申请/专利权人 INTERNATL BUSINESS MACH CORP IBM;

    申请/专利号JP19980199246

  • 发明设计人 MARIA RONNEY;

    申请日1998-07-14

  • 分类号C09K3/14;B24B37/00;H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-22 01:58:13

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