oberflächenmontierter checkpoint to private testing of circuits

• 1. 一种电池专用电压检查器检查电路 [P] . 中国专利： CN207488465U . 2018-06-12
• 2. 用于模拟集成电路测试系统的高压测试电源专用电路 [P] . 中国专利： CN202119878U . 2012.01.18
• 3. Three-dimensional processing system having at least one layer with circuitry dedicated to scan testing and system state checkpointing of other system layers [P] . 美国专利： US9696379B2 . 2017-07-04

  机译： 具有至少一层的三维处理系统，其电路专用于其他系统层的扫描测试和系统状态检查点

• 4. Three-dimensional processing system having at least one layer with circuitry dedicated to scan testing and system state checkpointing of other system layers [P] . 美国专利： US9383411B2 . 2016-07-05

  机译： 具有至少一层的三维处理系统，其电路专用于其他系统层的扫描测试和系统状态检查点

• 5. THREE-DIMENSIONAL PROCESSING SYSTEM HAVING AT LEAST ONE LAYER WITH CIRCUITRY DEDICATED TO SCAN TESTING AND SYSTEM STATE CHECKPOINTING OF OTHER SYSTEM LAYERS [P] . 美国专利： US2016209470A1 . 2016-07-21

  机译： 至少具有一层的三维处理系统，其电路专用于其他系统层的扫描测试和系统状态检查点

• 1. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits [J] . 王晓辉, 杨振雷, 童腾, 核技术（英文版） . 2015,第003期
• 2. A New Approach to Parity Testable Design for Combinational Circuits [J] . XU, Shi-yi 上海大学学报：英文版 . 2001,第0z1期
• 3. Towards Making Private Circuits Practical: DPA Resistant Private Circuits [C] . Park Jungmin, Tyagi Akhilesh IEEE Computer Society Annual Symposium on VLSI . 2014
• 4. Testing methods for current-mode integrated circuits under the very low cost tester (VLCT) and LabViewRTM test platform. [D] . Couttolenc Valdes, Sergio. 2004
• 5. Arsenic in Private Well Water Part I: Impact of the New Jersey Private Well Testing Act on Household Testing and Mitigation Behaviors [O] . Sara V. Flanagan, Steven E. Spayd, Nicholas A. Procopio, -1
• 6. Private Trajectory Intersection Testing: Is Garbled Circuit Better than Custom Protocols? [O] . 2021
• 7. State-of-the-Art Assessment of Testing and Testability of Custom LSI (Large Scale Integration)/VLSI (Very Large Scale Integration) Circuits. Volume VI. Redundancy, Testing Circuits, and Codes. [R] . Breuer, M. A., Carlan, A. J. 1982

• 1. Using Automation Controller System and Simulation Program for Testing Closed Circuits of Mini-Sprinkler Irrigation System [J] . Hani A. Mansour ,Hany M. Mehanna ,Mohamed E. El-Hagarey . 建模与仿真（英文） . 2013,第2期
• 2. Chair's Introduction to 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis [J] . Rueywen Liu . 电子科技学刊 . 2009,第004期
• 3. A Non-Scan Testable Design of Sequential Circuits by Improving Controllability [J] . Hideo Tamamoto ,Hiroshi Yokoyama ,Koji Seki and Naoko Obara . 湖南大学学报：自然科学版 . 2000,第S2期
• 4. 数据采集终端专用集成电路测试系统设计 [C] . 郭仙菊 ,李哲英 . 中国计算机用户协会网络应用分会2010年网络新技术与应用研讨会 . 2010
• 5. 纳米工艺集成电路成品率专用测试结构设计方法研究 [A] . 陈利生 . 2014