首页> 外国专利> METHOD FOR DIAGNOSING PATHOLOGIC INFLUENCE OF ARTIFICIAL DENTURE MATERIALS UPON ORAL CAVITY STATE

METHOD FOR DIAGNOSING PATHOLOGIC INFLUENCE OF ARTIFICIAL DENTURE MATERIALS UPON ORAL CAVITY STATE

机译:诊断口腔义齿对人造义齿材料影响的方法

摘要

FIELD: medicine. SUBSTANCE: method involves measuring bioelectromagnetic response index values on matched symmetry points selected on the external surface of the lips. The initial (primary) and the following (secondary) index values are measured. The secondary measurements are made with material sample placed between the patient lips. Asymmetry coefficients of the primary and secondary measurements are calculated from a formula z1 = (1-V1/V2) for V1 V2 or z1 = (1-V2/V1) for V1 V2 and for or for , where V1, V2 and , are the arithmetic means of the primary and secondary measurement indices on each of the symmetric parts of the lips. z2 z1 or z2 = z1 being the case, pathologic influence is diagnosed to take place. z2 z1 being the case, pathologic influence is diagnosed to be absent. EFFECT: enhanced reliability, accelerated manufacturing time; wide range of functional applications. 1 dwg
机译:领域:医学。实质:该方法涉及在嘴唇外表面上选择的匹配对称点上测量生物电磁响应指数值。测量初始(主要)和随后(次要)的索引值。使用放置在患者嘴唇之间的材料样本进行二次测量。根据V 1 =(1-V 1 / V 2 )计算一次和二次测量的不对称系数> 1 2 或z 1 =(1-V 2 / V 1 )对于V 1 2 表示<图像文件=” 00000003.GIF“ he =” 6“ id =” imag0.3“ imgContent =” undefined“ imgFormat =” GIF“ wi =” 14“ />或<图片文件=“ 00000004.GIF” he =“ 6” id =“ imag0.4” imgContent =“ undefined” imgFormat =“ GIF” wi =“ 28” /> for <图片文件=“ 00000005.GIF” he =“ 6“ id =” imag0.5“ imgContent =” undefined“ imgFormat =” GIF“ wi =” 14“ />,其中V 1 ,V 2 是在每个对称部分的主要和次要指标的算术平均值嘴唇z 2 1 或z 2 = z 1 的情况下,诊断为发生了病理影响。如果是z 2 1 ,则诊断为没有病理影响。效果:增强了可靠性,缩短了制造时间;广泛的功能应用。 1载重吨

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号