首页> 外国专利> Method for detecting external contour of objects being treated; prepares flat image for section of area being treated while specifying external contour spots in image surface of section

Method for detecting external contour of objects being treated; prepares flat image for section of area being treated while specifying external contour spots in image surface of section

机译:检测被治疗物体外轮廓的方法;在要处理区域的区域中准备平面图像,同时在区域的图像表面中指定外部轮廓点

摘要

A flat image for a section of an area to be treated is prepared. The image surface is vertical to a symmetry surface for this area. Image halves separated by the symmetry surface are coordinated by regular reflection on the symmetry surface. The image content difference between the coordinated halves is determined and information received is processed for specifying the external contour spots in the image surface of the section from the object being treated.
机译:准备要处理区域的一部分的平面图像。对于该区域,图像表面垂直于对称表面。被对称表面分开的两半通过对称表面上的正反射来协调。确定配准的两半之间的图像内容差,并且处理接收到的信息以指定来自被治疗物体的部分图像表面中的外部轮廓点。

著录项

  • 公开/公告号DE19829230A1

    专利类型

  • 公开/公告日2000-03-23

    原文格式PDF

  • 申请/专利权人 BRAINLAB MED. COMPUTERSYSTEME GMBH;

    申请/专利号DE1998129230

  • 发明设计人 BIRKENBACH RAINER;VILSMEIER STEFAN;

    申请日1998-06-30

  • 分类号G06T7/40;A61B6/00;A61B5/055;A61B9/00;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:42

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