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Method to determine thermal stresses in thick-walled components; involves deriving internal wall temperature, mean wall temperature and thermal stress from series of measured metal temperature values
Method to determine thermal stresses in thick-walled components; involves deriving internal wall temperature, mean wall temperature and thermal stress from series of measured metal temperature values
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机译:确定厚壁部件热应力的方法;涉及从一系列测得的金属温度值得出内壁温度,平均壁温和热应力
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摘要
The method involves direct measurement of a series of metal temperatures, TM, on the metal surface of the component, and supplying the data to a computer circuit in which the internal wall temperature, the mean wall temperature and the thermal stress are computed according to a given set of mathematical relationships. The internal wall temperature, Ti, is calculated from the equation, Ti = EPSILON mu =0n (a mu TM(tk - (n - mu ) DELTA T), the mean wall temperature, Tm, is calculated from the equation, Tm = EPSILON mu =0n (b mu TM(tk - (n - mu ) DELTA T) and the thermal stress, sigma , is calculated from the equation, sigma = C(Tm-Ti), where tk is the actual time, DELTA T is the adjusted down time, n is a parameter corresponding to the selected development number, mu is an integer between 0 and n, a mu and b mu are amplification factors, and C is the material constant. An Independent claim is also included for a circuit for implementing the method.
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机译:该方法包括直接测量组件金属表面上的一系列金属温度TM,并将数据提供给计算机电路,在计算机电路中,内壁温度,平均壁温和热应力根据给定一组数学关系。内壁温度Ti由等式Ti = EPSILON mu = 0n(mu TM(tk-(n-mu)DELTA T)计算,平均壁温Tm由等式Tm = EPSILON mu = 0n(b mu TM(tk-(n-mu)DELTA T),并且根据公式sigma = C(Tm-Ti)计算热应力sigma,其中tk是实际时间DELTA T是调整后的停机时间,n是与所选显影编号对应的参数,mu是0到n之间的整数,mu和b mu是放大因子,C是材料常数。用于实现该方法的电路。
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