X-ray analytical device for nondestructive testing of powder and liquid specimens; has graded multilayer Bragg reflector with specific characteristics

摘要

The device has a paraboloidal graded multilayer Bragg reflector (5) with layers applied to a concave surface of a substrate. The maximum form deviation, ripple and roughness, the angle of incidence of the X-ray beam (7) and the period thickness (d) of the reflector coating of the surface are specified The device has an X-ray source (6) and detector (10) and devices (14,15) to shape or limit the X-ray beam (7). A curved multilayer Bragg reflector (5) between the source and detector has a periodically repeating series of layers having different refractive indices. The period thickness varies continuously in the x-direction. The Bragg reflector is curved so that it forms a partial parabolic surface, in which the focal line or source of the X-ray source falls, so that it reflects a parallel X-ray beam. The reflector layers are vapor-deposited, sputtered or grown epitaxially onto a concave parabolic substrate.. An Independent claim is included for a curved multilayer Bragg reflector for incorporation in the device.