首页> 外国专利> Ultraviolet light detector for laser monitoring in photolithography has coating which converts incident UV radiation into light of longer wavelength

Ultraviolet light detector for laser monitoring in photolithography has coating which converts incident UV radiation into light of longer wavelength

机译:用于光刻中激光监控的紫外光检测器具有涂层,可将入射的紫外线辐射转换为更长波长的光

摘要

Light detector includes light-sensitive element (102) and frequency converting coating (104) that absorbs incident ultraviolet light and re-emits longer wavelength light in direction of the light sensitive element whose life is increased because the rate of growth of the dark current background noise in response to the total accumulated radiation exposure is reduced by a factor of ten or more. The coating converts incident radiation having a wavelength lass than 240 nm into light having wavelength greater than 240 nm. The light may be from an ArF excimer laser, an F2 laser or a YAG laser source. An Independent claim is given for a laser system with a light detector.
机译:光检测器包括光敏元件(102)和频率转换涂层(104),该频率转换涂层(104)吸收入射的紫外光,并沿光敏元件的方向重新发射更长波长的光,该光敏元件的寿命因暗电流背景的增长率而延长。响应于总累积辐射暴露的噪声减少了十倍或更多。该涂层将波长小于240 nm的入射辐射转换为波长大于240 nm的光。该光可以来自ArF准分子激光器,F2激光器或YAG激光源。对具有光检测器的激光系统提出了独立权利要求。

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