首页> 外国专利> Ion source for elemental analysis of solid samples comprises a chamber having an inlet channel, a suction-extraction channel, a cathode, a cylindrical hollow anode and an aperture allowing ions to enter a mass spectrometer

Ion source for elemental analysis of solid samples comprises a chamber having an inlet channel, a suction-extraction channel, a cathode, a cylindrical hollow anode and an aperture allowing ions to enter a mass spectrometer

机译:用于固体样品元素分析的离子源包括一个腔室,该腔室具有一个入口通道,一个抽吸-萃取通道,一个阴极,一个圆柱形空心阳极和一个允许离子进入质谱仪的孔

摘要

An ion source for elemental analysis of solid material samples (5) by analysis of the plasma of a low-pressure discharge consists of a chamber having an inlet channel (8), a suction-extraction channel (9) for a working gas as well as a cathode (2) and a cylindrical hollow anode (1). A plasma (10) is generated over the material sample and ions generated pass through an aperture for analysis by a mass spectrometer. An additional channel (11) for the extraction of working gas by suction leads into the chamber to the side of aperture (4) for emission of the ions to be analyzed.
机译:通过对低压放电等离子体进行分析来对固体材料样品(5)进行元素分析的离子源包括一个腔室,该腔室具有一个进气通道(8),一个用于工作气体的吸气/排气通道(9)阴极(2)和圆柱形空心阳极(1)。在材料样品上方产生等离子体(10),产生的离子通过孔口以通过质谱仪进行分析。用于通过抽吸提取工作气体的另一通道(11)通向腔室中至孔(4)的侧面,用于发射要分析的离子。

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